Title of article :
Enhanced avalanche multiplication factor and single-event burnout
Author/Authors :
S.، Kuboyama, نويسنده , , N.، Ikeda, نويسنده , , T.، Hirao, نويسنده , , S.، Matsuda, نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2003
Abstract :
We describe experimental data for single-event burnout of bipolar junction transistors and the results of analysis using device simulators. The analysis indicates that the enhanced impact ionization rate in the ion track plays an essential role to trigger the burnout.
Keywords :
Determination , Biodegradable dissolved organic carbon , Continuous , Cell immobilization , bioreactor
Journal title :
IEEE Transactions on Nuclear Science
Journal title :
IEEE Transactions on Nuclear Science
