Heavy-ion single-event effects testing of lead-on-chip assembled high-density memories

For space applications, can cost-effective and reliable heavy ion single-event effect (SEE) testing still be carried out on commercially available, plastic packaged, high-density memories? Their complexity, architecture, and packaging assemblies as well as their short life cycle pose many practical problems that needs to be tackled. This paper summarizes steps taken by the European Space Agency in order to address these issues.