Title of article :
Liquid surface order: X-ray reflectivity
Author/Authors :
P. S. Pershan، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 1996
Pages :
6
From page :
111
To page :
116
Abstract :
This note contains a brief summary of how the X-ray specular reflectivity technique can be used to measure electron density profiles across the bulk/vapor interface for a variety of liquids.
Journal title :
Physica A Statistical Mechanics and its Applications
Serial Year :
1996
Journal title :
Physica A Statistical Mechanics and its Applications
Record number :
864183
Link To Document :
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