Title of article
XPS and PL studies of porous silicon treated in water and oxygen-rich gases
Author/Authors
S. P. Kobeleva، نويسنده , , T. G. Sergeeva، نويسنده , , B. M. Leiferov، نويسنده , , A. L. Ivanova، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 1997
Pages
5
From page
398
To page
402
Abstract
The chemical structure and luminescence properties of porous silicon (PS) were investigated by X-ray photoelectron (XPS) and photoluminescence (PL) spectroscopy. All of the as-anodized samples have two components of Si2p XPS spectra. Several models have been proposed to describe the large intensities of the oxygen component of these spectra. The structure of the silicon oxide in PS after treatment in oxygen-rich gases is more ordered than in both as-anodized and water-treated samples.
Journal title
Physica A Statistical Mechanics and its Applications
Serial Year
1997
Journal title
Physica A Statistical Mechanics and its Applications
Record number
864750
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