The critical current density Jc in high quality YBa2Cu3O7-δ thin films

We have studied the critical current density Jc in high quality c-axis oriented YBa2Cu3O7-δ thin films. To determine Jc as a function of temperature, magnetic field, we have realized the systematical measure of the J-E characteristic in large range of temperature with an increment of 0.2 K for each magnetic field value. The critical current density decreases as the temperature increases. For each magnetic field value, we observed two regimes in the critical current density Jc(T) behavior. The same behavior was obtained in the Jc(H) variations.