Title of article :
Thermal oxidation of AlGaAs: modeling and process control
Author/Authors :
Ku، Pei-Cheng نويسنده , , Chang-Hasnain,C.J.، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2003
Pages :
-576
From page :
577
To page :
0
Abstract :
A simple physical model is developed for the thermal oxidation process of AlGaAs using the continuity equation. The model is based on the principle of oxidant mass conservation. Theoretical calculations are compared with experimental data to a good agreement. The model is then applied to the study of VCSEL batch fabrication. Several control parameters are discussed including AlGaAs layer thickness, aluminum composition, initial mesa size, spacing between two adjacent devices, oxidation time, and oxidation temperature.
Keywords :
filtering , Performance , ranked output
Journal title :
IEEE JOURNAL OF QUANTUM ELECTRONICS
Serial Year :
2003
Journal title :
IEEE JOURNAL OF QUANTUM ELECTRONICS
Record number :
87186
Link To Document :
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