Title of article
Measuring architectural vulnerability factors
Author/Authors
S.S.، Mukherjee, نويسنده , , C.T.، Weaver, نويسنده , , J.، Emer, نويسنده , , S.K.، Reinhardt, نويسنده , , T.، Austin, نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2003
Pages
-6
From page
7
To page
0
Abstract
Processor designers need accurate estimates of soft-error rates early in the design cycle to make appropriate cost-reliability tradeoffs. Here, the authors present a method for estimating the architectural vulnerability factor—the probability that a fault in a particular structure will result in an error.
Keywords
photonics , Application
Journal title
IEEE MICRO
Serial Year
2003
Journal title
IEEE MICRO
Record number
90238
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