Title of article :
Measuring architectural vulnerability factors
Author/Authors :
S.S.، Mukherjee, نويسنده , , C.T.، Weaver, نويسنده , , J.، Emer, نويسنده , , S.K.، Reinhardt, نويسنده , , T.، Austin, نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2003
Pages :
-6
From page :
7
To page :
0
Abstract :
Processor designers need accurate estimates of soft-error rates early in the design cycle to make appropriate cost-reliability tradeoffs. Here, the authors present a method for estimating the architectural vulnerability factor—the probability that a fault in a particular structure will result in an error.
Keywords :
photonics , Application
Journal title :
IEEE MICRO
Serial Year :
2003
Journal title :
IEEE MICRO
Record number :
90238
Link To Document :
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