• Title of article

    Embedded boundary scan

  • Author/Authors

    B.G.، Van Treuren, نويسنده , , J.M.، Miranda, نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2003
  • Pages
    -1
  • From page
    2
  • To page
    0
  • Abstract
    As boundary scan technology continues to mature, engineers continue to find innovative ways of using the IEEE Std. 1149.1 facilities throughout the life cycle of a board. Lucent Technologies is at the forefront of this development, and the authors here describe how they have expanded the use and reuse of the IEEE 1149.1 board tests into a variety of additional test environments.
  • Keywords
    leukemia
  • Journal title
    IEEE Design and Test of Computers
  • Serial Year
    2003
  • Journal title
    IEEE Design and Test of Computers
  • Record number

    90269