Title of article :
Embedded boundary scan
Author/Authors :
B.G.، Van Treuren, نويسنده , , J.M.، Miranda, نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2003
Pages :
-1
From page :
2
To page :
0
Abstract :
As boundary scan technology continues to mature, engineers continue to find innovative ways of using the IEEE Std. 1149.1 facilities throughout the life cycle of a board. Lucent Technologies is at the forefront of this development, and the authors here describe how they have expanded the use and reuse of the IEEE 1149.1 board tests into a variety of additional test environments.
Keywords :
leukemia
Journal title :
IEEE Design and Test of Computers
Serial Year :
2003
Journal title :
IEEE Design and Test of Computers
Record number :
90269
Link To Document :
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