Title of article :
Embedded boundary scan
Author/Authors :
B.G.، Van Treuren, نويسنده , , J.M.، Miranda, نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2003
Abstract :
As boundary scan technology continues to mature, engineers continue to find innovative ways of using the IEEE Std. 1149.1 facilities throughout the life cycle of a board. Lucent Technologies is at the forefront of this development, and the authors here describe how they have expanded the use and reuse of the IEEE 1149.1 board tests into a variety of additional test environments.
Journal title :
IEEE Design and Test of Computers
Journal title :
IEEE Design and Test of Computers