Title of article
Embedded-memory test and repair: infrastructure IP for SoC yield
Author/Authors
Y.، Zorian, نويسنده , , S.، Shoukourian, نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2003
Pages
-57
From page
58
To page
0
Abstract
Todayʹs complex SoCs need sophisticated infrastructure IP, not only to test and diagnose embedded memories but also to repair them and improve fabrication yield. The authors solution integrates memory IP with test and repair IP in a composite infrastructure IP that ensures manufacturing and field repair efficiency and optimizes SoC yield.
Keywords
leukemia
Journal title
IEEE Design and Test of Computers
Serial Year
2003
Journal title
IEEE Design and Test of Computers
Record number
90282
Link To Document