Title of article
Benefits of a SoC-specific test methodology
Author/Authors
M.S.، Quasem, نويسنده , , Jiang، Zhigang نويسنده , , S.K.، Gupta, نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2003
Pages
-67
From page
68
To page
0
Abstract
The tradeoff between IP protection and SoC-level test optimization has been an issue for some time. The more IP providers protect their IP, the less flexibility system developers have to control test costs and fault coverage. In this paper, a new approach dynamically extracts IPrelated test information or optimizing SoC testing without jeopardizing IP protection.
Keywords
leukemia
Journal title
IEEE Design and Test of Computers
Serial Year
2003
Journal title
IEEE Design and Test of Computers
Record number
90283
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