Title of article :
Achieving at-speed structural test
Author/Authors :
S.، Pateras, نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2003
Pages :
-25
From page :
26
To page :
0
Abstract :
In addition to structural test, BIST offers an alternative low-cost approach to at-speed testing. How should BIST be implemented to address at-speed testing? What issues remain to be solved? How can we deal with multicycle paths and different frequency domains? The author describes BIST implementation techniques to answer these questions.
Keywords :
leukemia
Journal title :
IEEE Design and Test of Computers
Serial Year :
2003
Journal title :
IEEE Design and Test of Computers
Record number :
90294
Link To Document :
بازگشت