Author/Authors :
Qian، Wei-Jun نويسنده , , J.، Rajski, نويسنده , , N.، Tamarapalli, نويسنده , , M.، Kassab, نويسنده , , N.، Mukherjee, نويسنده , , J.، Tyszer, نويسنده ,
Abstract :
You have probably heard that BIST takes too long and its fault coverage is low, and that deterministic test requires too many patterns. This article shows how on-chip compression and decompression techniques provide high fault coverage with low test times.
