• Title of article

    Embedded deterministic test for low-cost manufacturing

  • Author/Authors

    Qian، Wei-Jun نويسنده , , J.، Rajski, نويسنده , , N.، Tamarapalli, نويسنده , , M.، Kassab, نويسنده , , N.، Mukherjee, نويسنده , , J.، Tyszer, نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2003
  • Pages
    -57
  • From page
    58
  • To page
    0
  • Abstract
    You have probably heard that BIST takes too long and its fault coverage is low, and that deterministic test requires too many patterns. This article shows how on-chip compression and decompression techniques provide high fault coverage with low test times.
  • Keywords
    leukemia
  • Journal title
    IEEE Design and Test of Computers
  • Serial Year
    2003
  • Journal title
    IEEE Design and Test of Computers
  • Record number

    90298

    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=10&DC=90298