Title of article :
Testing and characterization of SDRAMs
Author/Authors :
J.E.، Vollrath, نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2003
Abstract :
To improve yield and product quality, SDRAM manufacturers perform a variety of tests. A test sequence that incorporates retention tests, signal margin tests, and speed tests can help manufacturers find and repair weak memory cells.
Keywords :
mid-infrared , Quantum wells , quantum cascade laser , nonlinear optics , Second-harmonic generation , Intersubband transitions , multiple-wavelength emission
Journal title :
IEEE Design and Test of Computers
Journal title :
IEEE Design and Test of Computers
