Title of article
Testing and characterization of SDRAMs
Author/Authors
J.E.، Vollrath, نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2003
Pages
-41
From page
42
To page
0
Abstract
To improve yield and product quality, SDRAM manufacturers perform a variety of tests. A test sequence that incorporates retention tests, signal margin tests, and speed tests can help manufacturers find and repair weak memory cells.
Keywords
mid-infrared , Quantum wells , quantum cascade laser , nonlinear optics , Second-harmonic generation , Intersubband transitions , multiple-wavelength emission
Journal title
IEEE Design and Test of Computers
Serial Year
2003
Journal title
IEEE Design and Test of Computers
Record number
90342
Link To Document