Title of article
Boundary scan test standards
Author/Authors
P.J.، Ashenden, نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2003
Pages
-90
From page
91
To page
0
Abstract
I give an overview of several standards defining test technology based on boundary scan. The Test Technology Technical Council (MC), an IEEE Computer Society technical committee, sponsors these standards.
Keywords
Intersubband transitions , nonlinear optics , Second-harmonic generation , quantum cascade laser , Quantum wells , mid-infrared , multiple-wavelength emission
Journal title
IEEE Design and Test of Computers
Serial Year
2003
Journal title
IEEE Design and Test of Computers
Record number
90348
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