Title of article :
Nonlinear parametric test
Author/Authors :
C.R.N.، Teani, نويسنده , , A.M.، Jorge, نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2003
Abstract :
Using the nonlinear behavior of the structural components within the integrated circuit, the state space may be studied, and one observable state trajectory can identify parametric variations through Poincare maps. An opamp parametric test, using the proposed methodology, is presented.
Journal title :
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT
Journal title :
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT