Title of article :
Measuring resistance standards in terms of the quantized Hall resistance with a dual Josephson voltage standard using SINIS Josephson arrays
Author/Authors :
P.، Warnecke, نويسنده , , B.، Schumacher, نويسنده , , R.، Behr, نويسنده , , T.، Funck, نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2003
Abstract :
To determine arbitrary resistance ratios with high precision, a measuring system based on a dual Josephson voltage standard has been set up. It is demonstrated that, by means of this system, 10-k(Omega) standard resistors can be linked to a quantized Hall resistance (i=2, 12.9 k(Omega)) with an expanded uncertainty (k=2) of less than 4 parts in 10^9.
Journal title :
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT
Journal title :
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT