Author/Authors :
P.، Niewczas, نويسنده , , L.، Dziuda, نويسنده , , G.، Fusiek, نويسنده , , A.J.، Willshire, نويسنده , , J.R.، McDonald, نويسنده , , G.، Thursby, نويسنده , , D.، Harvey, نويسنده , , W.C.، Michie, نويسنده ,
Abstract :
In this paper, we present details of a solid state interrogation system based on a 16-channel arrayed waveguide grating (AWG) for interrogation of extrinsic FabryPerot interferometric sensors. The sensing element is configured in a reflecting mode and is illuminated by a broad-band light source through an optical fiber. The spectrum of light reflected from the sensor is analyzed using an AWG device acting as a coarse spectrometer. Using measurement points from the AWG channels, the original spectrum of the sensing element is reconstructed by a means of curve fitting. This allows sufficient information for the position of the reflection peak (or inverted peak) to be uniquely determined and the value of a measurement quantity obtained. In addition to the theoretical simulations of the proposed measurement system, we provide details of the laboratory evaluation.