Title of article :
Comparisons of the symmetric and asymmetric control limits for X and R charts q
Author/Authors :
Huifen Chen، نويسنده , , Wei-Lun Kuo b، نويسنده ,
Issue Information :
ماهنامه با شماره پیاپی سال 2010
Pages :
8
From page :
903
To page :
910
Abstract :
Though both symmetric and asymmetric control limits can be applied to X and R charts, no well-controlled comparison of the resulting performance has been conducted. Symmetric limits such as 3-sigma limits are the customary choice. However, previous researchers have proposed asymmetric control limits as a more appropriate choice than symmetric limits for skewed distributions. This paper examines the relative performance of symmetric and asymmetric limits. It compares the out-of-control average run length (ARL) for symmetric and asymmetric limits for fixed values of the in-control ARL. Two testing examples are employed: the exponential and Johnson unbounded distributions. The results of the performance comparison are mixed. For both X and R charts, the impact of the control limit choice (symmetric or asymmetric) depends on two factors: the skewness of the charting statistic (sample mean X for the X chart and sample range R for the R chart) and the shift direction. When the charting statistic has a rightskewed distribution, symmetric limits perform better if the monitored process property (the mean for the X chart and the standard deviation for the R chart) shifts upward, but worse when it shifts downward. When the charting statistic has a left-skewed distribution, the outcome is reversed. Although neither type of control limits dominates even for a skewed population, the asymmetric limits are more robust to the shift in the process mean or variation. The effect of the sample size is also discussed.
Keywords :
asymmetric control limits , Average run length , Skewed distribution , Shift , SPC
Journal title :
Computers & Industrial Engineering
Serial Year :
2010
Journal title :
Computers & Industrial Engineering
Record number :
926005
Link To Document :
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