Title of article :
Comparisons of the symmetric and asymmetric control limits for X and R charts q
Author/Authors :
Huifen Chen، نويسنده , , Wei-Lun Kuo b، نويسنده ,
Issue Information :
ماهنامه با شماره پیاپی سال 2010
Abstract :
Though both symmetric and asymmetric control limits can be applied to X and R charts, no well-controlled
comparison of the resulting performance has been conducted. Symmetric limits such as 3-sigma
limits are the customary choice. However, previous researchers have proposed asymmetric control limits
as a more appropriate choice than symmetric limits for skewed distributions. This paper examines the
relative performance of symmetric and asymmetric limits. It compares the out-of-control average run
length (ARL) for symmetric and asymmetric limits for fixed values of the in-control ARL. Two testing
examples are employed: the exponential and Johnson unbounded distributions. The results of the performance
comparison are mixed. For both X and R charts, the impact of the control limit choice (symmetric
or asymmetric) depends on two factors: the skewness of the charting statistic (sample mean X for the X
chart and sample range R for the R chart) and the shift direction. When the charting statistic has a rightskewed
distribution, symmetric limits perform better if the monitored process property (the mean for the
X chart and the standard deviation for the R chart) shifts upward, but worse when it shifts downward.
When the charting statistic has a left-skewed distribution, the outcome is reversed. Although neither type
of control limits dominates even for a skewed population, the asymmetric limits are more robust to the
shift in the process mean or variation. The effect of the sample size is also discussed.
Keywords :
asymmetric control limits , Average run length , Skewed distribution , Shift , SPC
Journal title :
Computers & Industrial Engineering
Journal title :
Computers & Industrial Engineering