Title of article
Failure mode analysis of oxide VCSELs in high humidity and high temperature
Author/Authors
Xie، Suning نويسنده , , R.W.، Herrick, نويسنده , , D.، Chamberlin, نويسنده , , S.J.، Rosner, نويسنده , , S.، McHugo, نويسنده , , G.، Girolami, نويسنده , , M.، Mayonte, نويسنده , , Kim، Seongsin نويسنده , , W.، Widjaja, نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2003
Pages
-1012
From page
1013
To page
0
Abstract
High-speed fiber-optic transceiver modules using parallel optics require that oxide-confined vertical-cavity surface-emitting lasers (VCSELs) be moisture resistant in a non-hermetic package. We have found that the conventional storage 85/85 (85 (degree)C/85% relative humidity) test does not adequately characterize oxide VCSELs moisture resistance. We have identified three failure modes in the oxide VCSELs under operating conditions in high humidity. In this paper, we discuss the failure mechanisms including dislocation growth, semiconductor cracks, and aperture surface degradation, all associated with operation under high relative humidity. Understanding of these failure modes has led to more appropriate qualification standards and environmentally robust oxide VCSELs.
Keywords
inhibition , activation , Metal ions , Salts
Journal title
Journal of Lightwave Technology
Serial Year
2003
Journal title
Journal of Lightwave Technology
Record number
92877
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