Properties of brush plated CdxZn1xTe thin films

CdxZn1 xTe (0 6 x 6 0.5) thin films were deposited for the first time by the brush plating technique using cadmium sulphate, zinc sulphate and tellurium dioxide precursors. The deposition current density was maintained at 100 mA cm 2. X-ray diffraction studies indicated the formation of cubic phase with (111), (220), (311) orientations. From optical absorption measurements the band gaps of the films are found to be direct. AFM studies indicate a surface roughness around 54A ˚ . Density of the films of different composition has been estimated. Laser Raman studies indicated CdTe like LO and TO phonons. 2007 Elsevier Ltd. All rights reserved.