Title of article
Test structure design considerations for RF-CV measurements on leaky dielectrics
Author/Authors
J.، Schmitz, نويسنده , , F.N.، Cubaynes, نويسنده , , R.J.، Havens, نويسنده , , R.، de Kort, نويسنده , , A.J.، Scholten, نويسنده , , L.F.، Tiemeijer, نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2004
Pages
-14
From page
15
To page
0
Abstract
We present an MOS capacitance-voltage measurement methodology that, contrary to present methods, is highly robust against gate leakage current densities up to 1000 A/cm^2. The methodology features specially designed RF test structures and RF measurement frequencies. It allows MOS parameter extraction in the full range of accumulation, depletion, and inversion.
Keywords
Schistosoma mansoni , GST , schistosomiasis , parasites , AST. , ALT , Colostrum , camel milk , lactoferrin
Journal title
IEEE Transactions on Semiconductor Manufacturing
Serial Year
2004
Journal title
IEEE Transactions on Semiconductor Manufacturing
Record number
95556
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