Title of article
Silicon planar technology for single-photon optical detectors
Author/Authors
F.، Zappa, نويسنده , , S.، Lombardo, نويسنده , , E.، Sciacca, نويسنده , , A.C.، Giudice, نويسنده , , D.، Sanfilippo, نويسنده , , R.، Consentino, نويسنده , , C.، Di Franco, نويسنده , , M.، Ghioni, نويسنده , , G.، Fallica, نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2003
Pages
-917
From page
918
To page
0
Abstract
Design and fabrication of single photon avalanche detector (SPAD) in planar technology is reported. Device design and critical issues in the technology are discussed. Experimental test procedures are described for darkcounting rate, afterpulsing probability, photon timing resolution, and quantum detection efficiency. Low-noise detectors are obtained, with dark counting rates down to 10 c/s for devices with 10 (mu)m diameter, down to 1 kc/s for 50 (mu)m diameter. The technology is suitable for monolithic integration of SPAD detectors and associated circuits.
Keywords
iterative method , noniterative method , boundary-layer equation , Laminar flow , Turbulent flow , nonlinear parabolic partial-differential equation
Journal title
IEEE TRANSACTIONS ON ELECTRON DEVICES
Serial Year
2003
Journal title
IEEE TRANSACTIONS ON ELECTRON DEVICES
Record number
95679
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