Title of article :
Monte Carlo simulations of the bandwidth of InAlAs avalanche photodiodes
Author/Authors :
Li، Ning نويسنده , , Ma، Zi-Feng نويسنده , , J.C.، Campbell, نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2003
Pages :
-2290
From page :
2291
To page :
0
Abstract :
We present a Monte Carlo simulation of the bandwidth of an InAlAs avalanche photodiode with an undepleted absorber. The carrier velocities are simulated in the charge layer and the multiplication region. It is shown that the velocity overshoot effect is not as significant as simpler models have suggested. At high electric field intensity, the electron effective saturation velocity is only slightly higher when impact ionization is significant, compared with when impact ionization is absent. The simulated 3 dB bandwidth is consistent with experiments for gains up to 50.
Keywords :
Flash electrically erasable programmable read-only memories (EEPROMs) , programming efficiency , Monte Carlo simulation , channel hot electron (CHE) , hot carriers , device scaling , channel initiated secondary electron (CHISEL)
Journal title :
IEEE TRANSACTIONS ON ELECTRON DEVICES
Serial Year :
2003
Journal title :
IEEE TRANSACTIONS ON ELECTRON DEVICES
Record number :
95936
Link To Document :
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