Title of article
A study of surface modification of silica using XPS, DRIFT and NMR Original Research Article
Author/Authors
A. Sommazzi and F. Garbassi، نويسنده , , L. Balducci، نويسنده , , P. Chiurlo، نويسنده , , L. Deiana، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 1995
Pages
7
From page
145
To page
151
Abstract
Silica has been treated in a slurry with several chloromethylsilanes and SiCl4. After treatment, the surfaces were characterized by XPS, DRIFT and 27Si-MAS NMR. The following reactivity scale was determined: TMCS > DCDMS > MTCS > TCS. XPS was found to be a very useful technique to complement NMR and vibrational spectroscopies, mainly from a quantitative point of view.
Journal title
Applied Surface Science
Serial Year
1995
Journal title
Applied Surface Science
Record number
989879
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