Author/Authors :
K. Piyakis، نويسنده , , E. Sacher، نويسنده , , A. Domingue، نويسنده , , J.-J. Pireaux، نويسنده , , G. Leclerc، نويسنده , , P. Bertrand، نويسنده , , J.B. Lhoest، نويسنده ,
Abstract :
Fluoropolymers are notoriously difficult to metallize. In order to ascertain the role of the substrate surface, the surface chemical structure of a representative fluoropolymer has been determined. Three techniques have been used to study the outer surfaces of the extruded fluoropolymer film, Teflon PFA. These techniques are: high-resolution electron energy-loss spectroscopy, phase-sensitive photoacoustic Fourier-transform infrared spectroscopy and time-of-flight secondary ion mass spectroscopy. These complementary techniques confirm that the extrusion process introduces a small amount of outer surface contamination, probably through the reaction of the hot extrudate with the atmosphere immediately on exiting the film-forming die.