Title of article
Preparation and characterization of self-assembly organic multilayer films on silica surface
Author/Authors
X.Q. Zhang ، نويسنده , , W.Y. Yang، نويسنده , , X.Z. You، نويسنده , , Y. Wei، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 1995
Pages
5
From page
267
To page
271
Abstract
The preparation and characterization of self-assembly organic multilayer films on hydroxylated silica (SiO2) surface are reported. The multilayer films, constructed via SiO cross-links and Schiff base reactions alternately, are characterized by advancing-contact-angle measurement, grazing-incidence IR spectroscopy and X-ray photoelectron spectroscopy. The results indicate that both SiO bonding and Schiff base reactions at the solid/liquid interface, on the employed strict experiment condition, are successful. The superlattice multilayer films have an ABAB…stacking sequence and good structural regularity. The aromatic moiety is interlocked between two short alkyl chains and perpendicular to the surface.
Journal title
Applied Surface Science
Serial Year
1995
Journal title
Applied Surface Science
Record number
989892
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