Title of article :
APFIM investigations on ordered γ-TiAl using single-layer detection method
Author/Authors :
J. Wesemann، نويسنده , , G. Frommeyer، نويسنده , , M. Kreuss، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 1995
Pages :
6
From page :
179
To page :
184
Abstract :
The defect structure in the γ-phase of an α2γ-Ti51Al46Cr3 alloy and the site occupation of chromium has been studied using atom-probe field-ion microscopy (APFIM). Because of the difficult separation of adjacent atomic layers during conventional APFIM measurements a video-controlled field-evaporation technique was carried out. The γ-phase is hyperstoichiometric in aluminium. Many Al antistructure atoms were detected in Ti layers but no Ti antistructure atoms were found in Al layers. Chromium has a strong preference for occupying Ti sites in the ordered γ-phase (L10 type of superlattice). This seems to be in contrast with the results obtained by ALCHEMI (atom location by channelling-enhanced microanalysis). However, this discrepancy can be explained with the dependence of the site preference of chromium on the local Al concentration.
Journal title :
Applied Surface Science
Serial Year :
1995
Journal title :
Applied Surface Science
Record number :
990093
Link To Document :
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