Title of article :
Observation of field-induced fragmentation of nickel clusters using scanning tunneling microscopy
Author/Authors :
M.V.H. Rao، نويسنده , , V. Srinivas، نويسنده , , V.V. Rao، نويسنده , , B.K. Mathur، نويسنده , , K.L. Chopra، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 1995
Pages :
5
From page :
417
To page :
421
Abstract :
Thin films of nickel deposited on mica have a surface structure in the form of a uniform distribution of clusters of ∼ 30 nm size. When an electrical pulse is applied to the film by the tip of an STM, these clusters get fragmented into smaller clusters. The fragmented clusters so produced were observed to coalesce together to regain the original morphology of the surface. The restoration process takes about 6 to 12 min depending on the height and width of the electrical pulse.
Journal title :
Applied Surface Science
Serial Year :
1995
Journal title :
Applied Surface Science
Record number :
990180
Link To Document :
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