Title of article :
Deposition of titanium nitride/tungsten layers for application in vertically integrated circuits technology
Author/Authors :
G. Ruhl، نويسنده , , B. Fr?schle، نويسنده , , P. Ramm، نويسنده , , A. Intemann، نويسنده , , W. Pamler، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 1995
Pages :
6
From page :
382
To page :
387
Abstract :
Chemical vapor deposition (CVD) processes were developed meeting the stringent requirements for the metallization of inter-chip-vias (ICV) in the vertical integration of chips technology. The metallization is done by highly conformal deposition of a titanium nitride glue layer in vias with extremely high aspect ratios as 7 : 1 and void-free filling of the vias with tungsten.
Journal title :
Applied Surface Science
Serial Year :
1995
Journal title :
Applied Surface Science
Record number :
990305
Link To Document :
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