Author/Authors :
H. Martinez، نويسنده , , C. Auriel، نويسنده , , D. Gonbeau، نويسنده , , M. Loudet and D. Gonbeau، نويسنده , , G. Pfister-Guillouzo، نويسنده ,
Abstract :
Scanning tunnelling microscopy, atomic force microscopy and X-ray photoelectron spectroscopy were used to study the surface of TiS2, a layered material. STM and AFM images in air and at room temperature revealed the trigonal symmetry of the lattice. After a few minutes exposure to air, we have shown by AFM and XPS the growth of a thin layer of TiO2 on the surface.
