Surface phases analysis by grazing incidence of X-rays in a Bragg-Brentano diffractometer

A technique which utilizes an unmodified commercial Bragg-Brentano X-ray diffractometer, for the study of thin surface layers is presented. The considered diffractometer setup permits data acquisition with Θ fixed at 1° and 2Θ scanning the Bragg line. The results obtained with this technique are shown for some examples regarding the study of surface or near surface interfaces.