Author/Authors :
S.T. Li، نويسنده , , Alfons Ritzer، نويسنده , , S. Proyer، نويسنده , , E. Stangl، نويسنده , , D. B?uerle، نويسنده , , N. Reschauer، نويسنده ,
Abstract :
An orientational dependence of the resistivity and critical current density was observed in c-axis oriented Bi2Sr2CaCu2O8+δ films grown on MgO substrates by pulsed-laser deposition. As derived from X-ray diffraction and scanning electron microscopy, the anisotropy is caused by the small tilt angle of the c-axis with respect to the substrate surface.
