Title of article
High sensitivity of positron-annihilation induced Auger-electron spectroscopy to surface impurities
Author/Authors
Toshiyuki Ohdaira، نويسنده , , Ryoichi Suzuki، نويسنده , , Tomohisa Mikado، نويسنده , , Hideaki Ohgaki، نويسنده , , Mitsukuni Chiwaki، نويسنده , , Tetsuo Yamazaki، نويسنده , , Masataka Hasegawa، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 1996
Pages
4
From page
73
To page
76
Abstract
We have carried out positron-annihilation induced Auger-electron spectroscopy (PAES) for a basal plane surface of MoS2 as an example for a layered material. It is found that PAES is very sensitive to the impurities on the surface compared with the conventional (electron excited) Auger-electron spectroscopy. It is known that the basal plane of MoS2 is inert to oxygen. However, when the surface was exposed to O2 gas, a strong Auger peak from oxygen appeared in the PAES spectrum. The present results suggest that positrons are trapped efficiently at surface defects such as vacancies and steps where the impurities are adsorbed preferentially.
Journal title
Applied Surface Science
Serial Year
1996
Journal title
Applied Surface Science
Record number
990760
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