Author/Authors :
S. SAITO، نويسنده , , M. ISHIHARA، نويسنده , , T. Tani، نويسنده , , T. Maeda، نويسنده , , N. Watanabe، نويسنده , , I. Rittaporn، نويسنده , , N. Koshizuka، نويسنده ,
Abstract :
The relationship between the intensity of the oxygen spectra from secondary ion mass spectroscopy (SIMS) and the electrical resistance in bulk was investigated for YBa2Cu4O8 in comparison with Bi2Sr2CaCu2O8. In spite of the change in the intensity of the oxygen spectra, the electrical resistance in bulk was almost constant up to the annealing process at ∼ 300°C. The change in the work function of YBa2Cu4O8 was also measured in order to characterize the surface electronic state. Superconductivity both at the surface and in bulk is discussed.
