Title of article
SPIX: a new technique for quantitative surface spectroscopy applied to SInP(001)
Author/Authors
L. Rodr?guez-Fern?ndez، نويسنده , , W.N. Lennard، نويسنده , , H. Xia، نويسنده , , G.R. Massoumi، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 1996
Pages
10
From page
289
To page
298
Abstract
A new technique for quantitative surface spectroscopy is described using charged particle X-ray excitation. The method is applied to determine a saturation coverage of 1.2 ± 0.24 ML for sulphur-passivated InP(001).
Journal title
Applied Surface Science
Serial Year
1996
Journal title
Applied Surface Science
Record number
990998
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