Author/Authors :
A.H. Levermann، نويسنده , , P.B. Howes، نويسنده , , K.A. Edwards، نويسنده , , H.T. Anyele، نويسنده , , C.C. Matthai، نويسنده , , J.E. Macdonald، نويسنده , , R. Feidenhansʹl، نويسنده , , L. Lottermoser، نويسنده , , L. Seehofer، نويسنده , , G. Falkenberg، نويسنده , , R.L. Johnson، نويسنده ,
Abstract :
We have studied the atomic structure of the (23×23)R°-Sn reconstruction induced by adsorption of about 1.1 monolayers of Sn on Si(111) using surface X-ray diffraction (SXRD) and scanning tunnelling microscopy (STM). The experimentally obtained structure factors in SXRD are in contradiction with existing models in the literature and we conclude the need for a new surface atomic structure model. We have been able to determine a number of properties of an appropriate surface model to allow a better fit to the experimental structure factors.
