Spatially resolved characterization of superconducting films and cryoelectronic devices by means of low temperature scanning laser microscope

The work describes the low temperature scanning laser microscopy technique used for spatially resolved characterization of superconducting films and film-based cryoelectronic circuits in the temperature range from 2 to 300 K. The determination of superconducting parameters for separate elements of a high Tc Josephson junctions array and imaging of the resistive transition in a high Tc superconducting polycrystalline film are demonstrated. The spatial evolution of the resistive state of a Sn thin film strip associated with the phase slip lines formation is visualized.