Title of article :
Modeling of silicon atomic-layer-epitaxy
Author/Authors :
Satoshi Sugahara، نويسنده , , Eiji Hasunuma، نويسنده , , Sigeru Imai، نويسنده , , Masakiyo Matsumura، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 1996
Pages :
11
From page :
161
To page :
171
Abstract :
A kinetic model has been presented for atomic layer epitaxy of Si using cyclic exposures of SiH2Cl2 and atomic hydrogen. This model is based on the surface reaction of adsorbates formed by gas-phase reaction of SiH2Cl2. The ideal growth rate of one monolayer per cycle is achieved only when the dominant precursor is SiHCl. Limiting factors of the ALE window are also discussed.
Journal title :
Applied Surface Science
Serial Year :
1996
Journal title :
Applied Surface Science
Record number :
991244
Link To Document :
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