Title of article
Atomic layer etching of germanium
Author/Authors
Keiji Ikeda، نويسنده , , Shigeru Imai، نويسنده , , Masakiyo Matsumura، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 1997
Pages
5
From page
87
To page
91
Abstract
Atomic layer etching of Ge has been investigated experimentally based on the surface chemistry that Cl can adsorb on the clean Ge surface at room temperature and desorb thermally as GeCl2 at high temperatures. The ideal etching rate of one monolayer per cycle has been achieved. The critical Cl2 dosage for the saturated etching rate was about 7.2×106 L. Increase of the surface roughness after etching of 100 cycles was about 3.5 monolayers.
Journal title
Applied Surface Science
Serial Year
1997
Journal title
Applied Surface Science
Record number
991504
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