• Title of article

    Atomic layer etching of germanium

  • Author/Authors

    Keiji Ikeda، نويسنده , , Shigeru Imai، نويسنده , , Masakiyo Matsumura، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 1997
  • Pages
    5
  • From page
    87
  • To page
    91
  • Abstract
    Atomic layer etching of Ge has been investigated experimentally based on the surface chemistry that Cl can adsorb on the clean Ge surface at room temperature and desorb thermally as GeCl2 at high temperatures. The ideal etching rate of one monolayer per cycle has been achieved. The critical Cl2 dosage for the saturated etching rate was about 7.2×106 L. Increase of the surface roughness after etching of 100 cycles was about 3.5 monolayers.
  • Journal title
    Applied Surface Science
  • Serial Year
    1997
  • Journal title
    Applied Surface Science
  • Record number

    991504