Title of article :
Atomic layer etching of germanium
Author/Authors :
Keiji Ikeda، نويسنده , , Shigeru Imai، نويسنده , , Masakiyo Matsumura، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 1997
Pages :
5
From page :
87
To page :
91
Abstract :
Atomic layer etching of Ge has been investigated experimentally based on the surface chemistry that Cl can adsorb on the clean Ge surface at room temperature and desorb thermally as GeCl2 at high temperatures. The ideal etching rate of one monolayer per cycle has been achieved. The critical Cl2 dosage for the saturated etching rate was about 7.2×106 L. Increase of the surface roughness after etching of 100 cycles was about 3.5 monolayers.
Journal title :
Applied Surface Science
Serial Year :
1997
Journal title :
Applied Surface Science
Record number :
991504
Link To Document :
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