Author/Authors :
N. Jiang، نويسنده , , M. Deguchi، نويسنده , , C.L. Wang، نويسنده , , J.H. Won، نويسنده , , H.M. Jeon، نويسنده , , Y. Mori، نويسنده , , A. Hatta، نويسنده , , M. Kitabatake، نويسنده , , T. Ito، نويسنده , , T. Hirao، نويسنده , , T. Sasaki، نويسنده , , A. Hiraki، نويسنده ,
Abstract :
A transmission electron microscope (TEM) study of ion-implanted chemical-vapor-deposited (CVD) diamond is presented. CVD diamond used for transmission electron microscope observation was directly deposited onto Mo TEM grids. As-deposited specimens were irradiated by C (100 keV) ions at room temperature with a wide range of implantation doses (1012–1017/cm2). Transmission electron diffraction (TED) patterns indicate that there exists a critical dose (Dc) for the onset of amorphization of CVD diamond as a result of ion induced damage and the value of critical dose is confirmed to be about 3 × 1015/cm2. The ion-induced transformation process is clearly revealed by high resolution electron microscope (HREM) images. For a higher dose implantation (7 × 1015/cm2) a large amount of diamond phase is transformed into amorphous carbon and many tiny misoriented diamond blocks are found to be left in the amorphous solid. The average size of these misoriented diamond blocks is only about 1–2 nm. Further bombardment (1017/cm2) almost kills all of the diamond phase within the irradiated volume and moreover leads to local formation of micropolycrystalline graphite.