Title of article
Investigation of metal/SiC interface using electron spectroscopy and scanning tunneling microscopy
Author/Authors
M. Hirai، نويسنده , , Y. Marumoto، نويسنده , , M. Kusaka، نويسنده , , M. Iwami and M. Yanagihara، نويسنده , , T. Ozawa، نويسنده , , T. Nagamura، نويسنده , , T. Nakata، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 1997
Pages
4
From page
360
To page
363
Abstract
Initial process of Co6HSiC(0001) contact has been intended to study using Auger electron spectroscopy (AES) and scanning tunneling microscopy (STM). Considering that 6HSiC(0001) has a polar surface i.e. Si or C terminated face, we first tried to study Co deposition on either Si(111)7 × 7 or a carbon film. Co silicide like CoSi2 starts to be formed when Co is deposited on a clean Si surface. AES and extended electron energy loss fine structure (EELFS) studies have clarified the fact that Co atoms form clusters when they are deposited on carbon films prepared on Si substrates, where Co clusters are found to be unreactive with a carbon film. Further it is suggested that the bond length between CoCo nearest neighbors shrinks for small cluster i.e. at the initial stage of the Co adsorption. Co atoms adsorbed on 6HSiC(001)6 × 6 reconstructed surface are likely to form clusters, which is the case for other reconstructed surfaces.
Journal title
Applied Surface Science
Serial Year
1997
Journal title
Applied Surface Science
Record number
991606
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