Title of article
Effects of impurities on the properties of amorphous silicon
Author/Authors
Masao Isomura، نويسنده , , Toshihiro Kinoshita، نويسنده , , Makoto Tanaka، نويسنده , , Shinya Tsuda ، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 1997
Pages
5
From page
754
To page
758
Abstract
Oxygen and nitrogen impurities increase the electrical conductivity of hydrogenated amorphous silicon (a-Si:H) films due to their donor-like behavior. An appropriate amount of boron doping compensates those donors so that the conductivity is restored to the original value unless alloying effects appear such as band gap widening. The creation of light-induced defects does not seem to be affected by the impurities, because the effects of the impurities are not obvious after light-soaking. The results indicate that the major effect of the oxygen and nitrogen is the creation of donors due to their small fraction and that a large amount of the rest impurities with inactive configurations show no other significant effect until alloying effects appear.
Journal title
Applied Surface Science
Serial Year
1997
Journal title
Applied Surface Science
Record number
991630
Link To Document