Title of article :
Positron beam lifetime spectroscopy of atomic scale defect distributions in bulk and microscopic volumes
Author/Authors :
Richard H. Howell، نويسنده , , a، نويسنده , , Thomas E. Cowana، نويسنده , , Jay Hartleya، نويسنده , , Philip Sternea، نويسنده , , Ben Brownb، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 1997
Pages :
6
From page :
7
To page :
12
Abstract :
We are developing a defect analysis capability based on two positron beam lifetime spectrometers: the first is based on a 3 MeV electrostatic accelerator and the second on our high current linac beam. The high energy beam lifetime spectrometer is operational and positron lifetime analysis is performed with a 3 MeV positron beam on thick sample specimens. It is being used for bulk sample analysis and analysis of samples encapsulated in controlled environments for in situ measurements. A second, low energy, microscopically focused, pulsed positron beam for defect analysis by positron lifetime spectroscopy is under development at the LLNL high current positron source. This beam will enable defect-specific, 3-dimensional maps of defect concentration with sub-micron location resolution. When coupled with first principles calculations of defect specific positron lifetimes it will enable new levels of defect concentration mapping and defect identification.
Journal title :
Applied Surface Science
Serial Year :
1997
Journal title :
Applied Surface Science
Record number :
991690
Link To Document :
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