Title of article
Positron beam lifetime spectroscopy of atomic scale defect distributions in bulk and microscopic volumes
Author/Authors
Richard H. Howell، نويسنده , , a، نويسنده , , Thomas E. Cowana، نويسنده , , Jay Hartleya، نويسنده , , Philip Sternea، نويسنده , , Ben Brownb، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 1997
Pages
6
From page
7
To page
12
Abstract
We are developing a defect analysis capability based on two positron beam lifetime spectrometers: the first is based on a 3 MeV electrostatic accelerator and the second on our high current linac beam. The high energy beam lifetime spectrometer is operational and positron lifetime analysis is performed with a 3 MeV positron beam on thick sample specimens. It is being used for bulk sample analysis and analysis of samples encapsulated in controlled environments for in situ measurements. A second, low energy, microscopically focused, pulsed positron beam for defect analysis by positron lifetime spectroscopy is under development at the LLNL high current positron source. This beam will enable defect-specific, 3-dimensional maps of defect concentration with sub-micron location resolution. When coupled with first principles calculations of defect specific positron lifetimes it will enable new levels of defect concentration mapping and defect identification.
Journal title
Applied Surface Science
Serial Year
1997
Journal title
Applied Surface Science
Record number
991690
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