Title of article
The study of multilayers View the MathML source and View the MathML source by slow positron beam technique
Author/Authors
Mutsumi Tashiro، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 1997
Pages
5
From page
263
To page
267
Abstract
The S-parameters versus the incident positron energy are measured in the View the MathML source multilayer, thin Hf film, thin Fe film and the bilayer View the MathML source. We have analyzed the change in vacancy-type defects in these multilayers and thin films with the deposition temperature in the MBE system.
Keywords
Magnetic multilayer , Amorphization , Vacancy-type defect , MBE , Positron annihilation , Slow positron beam
Journal title
Applied Surface Science
Serial Year
1997
Journal title
Applied Surface Science
Record number
991737
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