Title of article :
Electrical properties of ferroelectric BaMgF, films grown on GaAs substrates using AlGaAs buffer layer
Author/Authors :
Tomoki Hayashi، نويسنده , , Makoto Yoshihara، نويسنده , , Syun-ichiro Ohmi، نويسنده , , Eisuke Tokumitsu * ، نويسنده , , Hiroshi Ishiwara، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 1997
Pages :
5
From page :
418
To page :
422
Abstract :
Ferroelectric BaMgF, films have been grown on GaAs substrates with and without an AlGaAs buffer layer for metal-ferroelectric-semiconductor field effect transistor (MFSFET) applications. It is shown that the temperature range of 530-570°C is suitable to grow the (140)-oriented BaMgF, films on GaAs. Furthermore, it is demonstrated that the AlGaAs buffer layer is effective to reduce the leakage current. Capacitance-voltage (C-V) characteristics of Al/BaMgF,/AlGaAs/n-GaAs/n+-GaAs(100) structures show a hysteresis loop with a counterclockwise trace, demonstrating the ferroelectric nature of the BaMgF, film. On the other hand, the BaMgF, film directly grown on GaAs substrates has clockwise-hysteresis loops due to the charge injections. It is also shown that the remanent polarization estimated from the polarization-electric field (P-E) characteristics is as large as 1.2 @/cm*.
Keywords :
nonvolatile memory , AlGaAs , Ferroelectrics , BaMgF , GaAs
Journal title :
Applied Surface Science
Serial Year :
1997
Journal title :
Applied Surface Science
Record number :
991823
Link To Document :
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