Title of article :
Formation of zinc blende GaN using the conversion technique
Author/Authors :
T. Sukegawa *، نويسنده , , H. Katsuno، نويسنده , , S. Kawaguchi، نويسنده , , M. Kimura، نويسنده , , A. Tanaka، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 1997
Abstract :
It has been found that GaAs grown on GaP substrate was converted to GaN by annealing in the flow of NH,. Using LPE,
a GaAs layer of 5 pm thickness was grown on a GaP (1ll)B substrate. Then the GaAs layer was annealed in the flow of
100% NH, for 30-60 min at 800-850°C. The GaAs layer was completely converted to GaN. X-ray diffraction
measurements suggested that the GaN layer had mainly the zinc blende structure.
Keywords :
GaN , Conversion technique , Zinc blende structure , wurtzite structure , Photoluminescence
Journal title :
Applied Surface Science
Journal title :
Applied Surface Science