• Title of article

    Formation of zinc blende GaN using the conversion technique

  • Author/Authors

    T. Sukegawa *، نويسنده , , H. Katsuno، نويسنده , , S. Kawaguchi، نويسنده , , M. Kimura، نويسنده , , A. Tanaka، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 1997
  • Pages
    4
  • From page
    536
  • To page
    539
  • Abstract
    It has been found that GaAs grown on GaP substrate was converted to GaN by annealing in the flow of NH,. Using LPE, a GaAs layer of 5 pm thickness was grown on a GaP (1ll)B substrate. Then the GaAs layer was annealed in the flow of 100% NH, for 30-60 min at 800-850°C. The GaAs layer was completely converted to GaN. X-ray diffraction measurements suggested that the GaN layer had mainly the zinc blende structure.
  • Keywords
    GaN , Conversion technique , Zinc blende structure , wurtzite structure , Photoluminescence
  • Journal title
    Applied Surface Science
  • Serial Year
    1997
  • Journal title
    Applied Surface Science
  • Record number

    991844