Title of article
Formation of zinc blende GaN using the conversion technique
Author/Authors
T. Sukegawa *، نويسنده , , H. Katsuno، نويسنده , , S. Kawaguchi، نويسنده , , M. Kimura، نويسنده , , A. Tanaka، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 1997
Pages
4
From page
536
To page
539
Abstract
It has been found that GaAs grown on GaP substrate was converted to GaN by annealing in the flow of NH,. Using LPE,
a GaAs layer of 5 pm thickness was grown on a GaP (1ll)B substrate. Then the GaAs layer was annealed in the flow of
100% NH, for 30-60 min at 800-850°C. The GaAs layer was completely converted to GaN. X-ray diffraction
measurements suggested that the GaN layer had mainly the zinc blende structure.
Keywords
GaN , Conversion technique , Zinc blende structure , wurtzite structure , Photoluminescence
Journal title
Applied Surface Science
Serial Year
1997
Journal title
Applied Surface Science
Record number
991844
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