Title of article :
Nucleation and growth of View the MathML source observed by atomic force microscopy
Author/Authors :
V. Rejon and R. Castro-Rodriguez، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 1998
Pages :
7
From page :
58
To page :
64
Abstract :
Strontium titanate thin films were studied with X-ray diffraction and atomic force microscopy during growth at different pressures and temperatures. The nucleation process on top of the islands grown was directly observed with high-resolution. The surface morphology of the films was found to depend on the ambient oxygen pressure and substrate temperature during growth. The films were grown by pulsed laser deposition at different ambient oxygen pressure. The surface roughness of the films decreased with decreasing ambient oxygen growth pressure and with increasing substrate temperatures. The high nucleation probability on top of the films results in an effective mass transport on top of the first-layer islands.
Keywords :
Ferroelectric thin film , Strontium titanate , Pulsed laser deposition
Journal title :
Applied Surface Science
Serial Year :
1998
Journal title :
Applied Surface Science
Record number :
992312
Link To Document :
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