Title of article :
Study of the electronic and adsorption structure of Cs and H coadsorption on Si(100)2×1
Author/Authors :
M Shimizu، نويسنده , , H Hasebe، نويسنده , , S Hongo، نويسنده , , K Ojima، نويسنده , , T Urano، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 1998
Pages :
5
From page :
271
To page :
275
Abstract :
The coadsorption structure and electronic states of Cs and H on Si(100)2×1 were investigated by means of MDS (metastable de-excitation spectroscopy) and TDS (thermal desorption spectroscopy). The both systems of Cs/H/Si and H/Cs/Si have the same TDS profile, which indicates that Si dangling bonds are partly terminated with H atoms in both systems and CsH formed at the Cs coverages above about 0.4 ML is dissociated into H and Cs, resulting in H2 desorption at about 20°C. On the other hand, MDS spectra for the H/Cs/Si system differ from those for Cs/H/Si one, i.e., Cs–H bonds can be clearly seen in case of the H/Cs/Si systems, while not in case of the Cs/H/Si systems. The difference in MDS spectra between both systems can be explained as follows: in case of the Cs/H/Si systems, all hydrogen atoms including Cs–H bonds are located between Cs layer and Si substrate, while in case of the H/Cs/Si systems, some of the hydrogen atoms forming Cs–H bonds are on the outermost surface.
Keywords :
Metastable de-excitation spectroscopy (MDS) , Thermal desorption spectroscopy (TDS) , Cesium , Silicon , Hydrogen
Journal title :
Applied Surface Science
Serial Year :
1998
Journal title :
Applied Surface Science
Record number :
992613
Link To Document :
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