Title of article :
Nucleation mechanisms during MBE growth of lattice-matched and strained III–V compound films
Author/Authors :
B.A. Joyce، نويسنده , , D.D. Vvedensky، نويسنده , , A.R. Avery، نويسنده , , J.G Belk، نويسنده , , H.T. Dobbs، نويسنده , , T.S. Jones، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 1998
Pages :
10
From page :
357
To page :
366
Abstract :
Molecular beam epitaxy MBE.is an ideal vehicle for the study of initial growth processes in thin film growth, both for the degree of control available in the amount of material deposited and for its compatibility with in situ diagnostic probes. In this paper we discuss nucleation mechanisms involved in the growth of GaAs on GaAs and InAs on GaAs from elemental sources, in each case on the three low index substrate orientations, i.e. 001., 110.and 111.A. We have used a combination of reflection high energy electron diffraction RHEED.and scanning tunnelling microscopy STM.to measure both dynamic changes and nucleation events over the range 0.05 to 5.0 monolayers MLs.. These data have been analysed using scaling theory, dynamic Monte Carlo simulation and self-consistent rate equations. Perhaps the most important and striking feature of the results is the uniqueness of behaviour of the 001.orientation in both material systems. q1998 Elsevier Science B.V. All rights reserved.
Keywords :
strain relaxation , Distribution functions , Orientation effects , MBE , Nucleation
Journal title :
Applied Surface Science
Serial Year :
1998
Journal title :
Applied Surface Science
Record number :
992628
Link To Document :
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