Title of article :
Nucleation mechanisms during MBE growth of lattice-matched
and strained III–V compound films
Author/Authors :
B.A. Joyce، نويسنده , , D.D. Vvedensky، نويسنده , , A.R. Avery، نويسنده , , J.G Belk، نويسنده , , H.T. Dobbs، نويسنده , , T.S. Jones، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 1998
Abstract :
Molecular beam epitaxy MBE.is an ideal vehicle for the study of initial growth processes in thin film growth, both for
the degree of control available in the amount of material deposited and for its compatibility with in situ diagnostic probes. In
this paper we discuss nucleation mechanisms involved in the growth of GaAs on GaAs and InAs on GaAs from elemental
sources, in each case on the three low index substrate orientations, i.e. 001., 110.and 111.A. We have used a combination
of reflection high energy electron diffraction RHEED.and scanning tunnelling microscopy STM.to measure both dynamic
changes and nucleation events over the range 0.05 to 5.0 monolayers MLs.. These data have been analysed using scaling
theory, dynamic Monte Carlo simulation and self-consistent rate equations. Perhaps the most important and striking feature
of the results is the uniqueness of behaviour of the 001.orientation in both material systems. q1998 Elsevier Science B.V.
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Keywords :
strain relaxation , Distribution functions , Orientation effects , MBE , Nucleation
Journal title :
Applied Surface Science
Journal title :
Applied Surface Science