Title of article
Interfacial profile of a Bragg Mirror
Author/Authors
M.K. Sanyal، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 1998
Pages
5
From page
98
To page
102
Abstract
X-ray reflectivity and secondary ion mass spectrometry studies of a Bragg Mirror are presented. We find that the AlAs-on-AlGaAs interfaces are diffused due to formation of continuously varying composition of AlxGa1−xAs at the interfaces. On the other hand, the AlGaAs-on-AlAs interfaces are found to be sharp.
Keywords
X-ray reflectivity , Secondary ion mass spectrometry , Semiconductor multilayers , Interdiffusion , Asymmetric interfaces
Journal title
Applied Surface Science
Serial Year
1998
Journal title
Applied Surface Science
Record number
992736
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